A Comparison of Three Ionic Test Methods

This study investigates the strengths and weaknesses of three different methods used to test for ionic contamination.

In electronics manufacturing, the accepted industry standard test for ionic contamination is Surface Insulation Resistance (SIR) testing. Unfortunately, this test can take weeks, and product batches often ship before their SIR test results come in. The industry is looking for a better test—one that allows companies to identify and correct manufacturing flaws before shipping a product to their customers.

This white paper explores two alternatives to SIR testing:

• Resistivity of Solvent Extract (ROSE) testing

• Critical Cleanliness Control (C3) Localized Ionics Testing