Want to find out if your PCBAs are clean?

The Foresite C3 (Critical Cleanliness Control) is unique among electronics cleanliness testers – it remains the only tester on the market that indicates whether a specific, critical area of a PCBA is clean.

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The C3 can provide immediate process monitoring data or even incoming material cleanliness assessment.

The C3/C.I. tracks the cleanliness of critical areas of your electronics over time with the Foresite C3 Corrosivity Index – a single test result that can be used to monitor and control manufacturing processes (and incoming component cleanliness).

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Additional Notes

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Frequently Asked Questions

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User Manual (PDF)

Extraction Solution SDS (PDF)

The C3

Critical Cleanliness Control

The C3 extracts an approx. 2.2 mL sample into a collection cell. The sample can be used for other testing such as ion chromatography.

The single-use test cell is inserted into the steam head. At the completion of the test, the cell is removed from the head with the help of the ejector bar.

The C3 test cell tests a 0.1 in2 area. — The single-use test cell is inserted into the steam head. At the completion of the test, the cell is removed from the head with the help of the ejector bar. The C3 test cell tests a 0.1 in2 area.

Extraction solution, vacuum and metering pump storage drawer

C3 Test Cell Measuring SMT Component Cleanliness

Consumable Items for C3 Usage, C3 Test Cells and Extraction Solution

How the C3 works

Simply select the components and/or areas of circuitry that are most sensitive and prone to contamination-related performance and/or reliability issues and test an area that is 0.1 in², or even smaller.

The C3 quickly provides feedback as to whether potentially detrimental residues, frequently from manufacturing processes, are present. The programmed test cycle is easily controlled with minimal training.

Extraction, Testing, or Both

The C3 can be used right in the electronics assembly area. In addition, product site-specific samples extracted by the C3 can be sent to a lab for analysis to identify the contaminants and measure their concentrations.

Areas to Test

Typical areas of extraction for process evaluation:

Connector Leads from Selective Soldering

Additional Areas to Test

You can also use the C3 to test:

Incoming bare boards
Incoming components
Reworked component areas
Sites of visible corrosion

C3 Corrosivity Index™ (C.I.)

The C.I. is an indicator of the cleanliness of a test site analyzed by the C3. The index is calculated by dividing the maximum current seen during the test by the elapsed time of the test.

Using a programmable current limit setting of 250 µA and a decision time setting of 120 seconds, the C.I. limit is (250/120) 2.08.

A C3 test performed with these settings that reaches or exceeds 250 µA before 120 seconds has a C.I. greater than 2.08, resulting in a “dirty” indication. These test parameter settings (250 µA & 120 sec.) produce relatively sensitive C3 tests and are commonly used on higher reliability electronics (e.g. IPC Class II & III).

For the above test, C.I. = 250/95 = 2.63, a failed test.

The C.I. graph below shows the curve of C.I. values when the set current limit (250 µA) is reached, or exceeded, through the range of elapsed test times.

The “maximum” current used in a C.I. calculation is limited to the current set point (250 µA in these examples). The C3 test runs until the current exceeds the current set point (limit) or the total test time of 180 seconds is reached.

In this example, two samples pass the test in that the current limit is not reached by the decision time.

Another commonly used set of C3 test parameters is 500 µA and 60 seconds. These settings are used on electronics for less demanding applications and environments (e.g. IPC Class I). The C.I. limit when using these settings would be (500/60) 8.33.

The C3 Corrosivity Index provides a single test result value that can be plotted over time to track trending in product cleanliness – the lower the C.I. the less likely a tested product site will suffer performance problems due to the presence of a detrimental ionic residue.

Sample A (Blue Line): C.I. = 250/135 = 1.85 Sample B (Black Line): C.I. = 225/180 = 1.25 — Sample A (Blue Line): C.I. = 250/135 = 1.85
Sample B (Black Line): C.I. = 225/180 = 1.25

Testimonials

We are using this for ensuring the cleanliness on all products irrespective of customer/cleaning process/consumables. This is an excellent method for this.

– SFO

This unit came with friendly user operations. Easy start-up, gentle touch to operate.

– Sanmina-SCI

I feel C3 is very useful tool for cleanliness tests and the results are very straight forward which is user-friendly.

– Jabil

We are pleased with the performance of the C3. We use it to evaluate PCB, and process cleanliness, as well as for product/process design work.

– Daktronics Inc.

The C3 tester is easy to use and has been very helpful not only during production to monitor PCB cleanliness but has been
instrumental in identifying ionic contamination on PCBs during engineering environmental testing.

– YESCO Electronics

It has been an excellent tool for diagnostic. We have been using it a lot because of its capabilities at our laboratory.

– Delphi

The C3 unit has provided Samtec a valuable tool to ensure our electronic flex assemblies meet the expectations of our customer cleanliness requirements.

– Samtec

The C3 is a wonderful go-no go test. It provides good results and rapidly. The customer service is very good, we always receive quick responses in a timely matter.

– Ultra Electronics

The C3 has worked extremely well. Initial start-up and familiarization were very easy. Interest in the C3 has increased tremendously now that other engineers have heard about it.

– Whirlpool

I have found the C3 to be a very useful tool and will use it in the future for all extractions where there is no interference. I am in the process of relating my manual extractions to the C3 extraction. At present time the C3 is not used daily, only when needed

– Continental Corporation

By utilizing the Foresite C3 tester, DSI was able to quickly configure and optimize our new vertical circuit washing system parameters (main conveyor speed, saponifier concentration, nozzle configurations, process temperatures and oven dry time). This task would not have been feasible without having the C3 tester for immediate feedback and adjustments.

- DSI

We have developed a contamination control plan based on the ability to take key process measurements with the C3 tester. We now have real-time feedback to Process Engineering and Mfg. and can make adjustments immediately to maintain contamination within acceptable limits.

– Universal Lighting